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P. Spirito

University of Naples Federico II

148

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INFRARED THERMOGRAPHY APPLIED TO POWER ELECTRON DEVICES INVESTIGATION

2015 Facta universitatis. Series electronics and energetics
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Energy and current crowding limits in avalanche operation of IGBTs

2013 ISPSD | International Symposium on Power Semiconductor Devices and IC's
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Experimental Detection and Numerical Validation of Different Failure Mechanisms in IGBTs During Unclamped Inductive Switching

2013 IEEE Transactions on Electron Devices
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An Experimental Power-Lines Model for Digital ASICs Based on Transmission Lines

2012 IEEE Transactions on Very Large Scale Integration Systems
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3D electro-thermal simulations of wide area power devices operating in avalanche condition

2012 Microelectronics Reliability
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Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments

2012 ISPSD | International Symposium on Power Semiconductor Devices and IC's
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Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: Experiments and simulations

2011 ISPSD | International Symposium on Power Semiconductor Devices and IC's
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A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing

2010 Microelectronics Reliability
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Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography

2010 Microelectronics Reliability
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Thermal Instability in Power Bipolar Transistors:Experimental Data and Electro-Thermal Simulation

2010 DRC | Device Research Conference
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