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Thomas A. Leonard

University of Dayton Research Institute

6

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14

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Book Rvw: Optical Scattering: Measurement and Analysis. By John C. Stover

1990 Optical Engineering
- Thomas A. Leonard
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Design and Construction of a Single Polarizer Infrared Ellipsometer/Reflectometer for Characterization of Highly Curved Surfaces

1988
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Application Of IR Ellipsometry/Reflectometry To Surface Metrology

1985
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Infrared Ellipsometry On Silicon Wafers

1984
- Thomas A. Leonard
- John S. Loomis
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Design and Construction of Three Infrared Ellipsometers for Thin-Film Research

1982 Optical Engineering
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Infrared Polarizer Selection

1981
- Thomas A. Leonard
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