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E. Abric
E. Abric
Wafer
Laser
Laser pumping
Nondestructive testing
Optoelectronics
2
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6
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Comparative Analysis of Slurry and Diamond Sawing Methods Using Raman Spectroscopy on Monocrystalline Silicon Wafers
2012
PEC | World Conference on Photovoltaic Energy Conversion
B. Lombardet
J. Penaud
E. Abric
C. Takchi
Nada Habka
P. Jaffrennou
M. Radet
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Non-destructive characterization of saw damage in silicon photovoltaics substrates by means of photomodulated optical reflectance
2012
Physica Status Solidi (c)
Janusz Bogdanowicz
Paul W. Mertens
Emanuele Cornagliotti
Kurt Wostyn
Julien Penaud
P. Jaffrennou
E. Abric
Wilfried Vandervorst
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