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Q.-H. Duong
Q.-H. Duong
Centre national de la recherche scientifique
Engineering
Electronic engineering
Microelectromechanical systems
Deflection (engineering)
Finite element method
4
Papers
13
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Thermal and electrostatic reliability characterization in RF MEMS switches
2005
Microelectronics Reliability
Q.-H. Duong
Lionel Buchaillot
Dominique Collard
Petra Schmitt
Xavier Lafontan
Patrick Pons
F. Flourens
Francis Pressecq
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Citations (5)
Biaxial initial stress characterization of bilayer gold RF-switches
2005
Microelectronics Reliability
K. Yacine
F. Flourens
David Bourrier
L. Salvagnac
P. Calmont
Xavier Lafontan
Q.-H. Duong
L. Bucaillot
David Peyrou
Patrick Pons
Robert Plana
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Citations (6)
MEMS Reliability: from experimental results to the understanding of physical phenomena
2004
Francis Pressecq
Petra Schmitt
David Veyrie
Q.-H. Duong
Djemel Lellouchi
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Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling
2003
Microelectronics Reliability
Petra Schmitt
Francis Pressecq
Xavier Lafontan
Q.-H. Duong
Patrick Pons
Jean Marc Nicot
Coumar Oudéa
D. Estève
Jean-Yves Fourniols
Henri Camon
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Citations (2)
1