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Carlo Cremonesi
Carlo Cremonesi
STMicroelectronics
Oxide
Electronic engineering
Engineering
Materials science
Optoelectronics
5
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3
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0
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Defect generation and suppression in device processes using a shallow trench isolation scheme
2003
Daniela Peschiaroli
M. Brambilla
Gianpietro Carnevale
A. Cascella
F. Cazzaniga
Cesare Clementi
Carlo Cremonesi
Annalisa Gilardini
M. Martinelli
Alfonso Maurelli
I. Mica
Alessia Pavan
G. Pavia
Fausto Piazza
Maria Luisa Polignano
Valter Soncini
E. Bonera
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An analysis of the effect of the steps for isolation formation on STI process integration
2003
Alessia Pavan
Daniela Brazzelli
Marta Aiello
Chiara Capolupo
Cesare Clementi
Carlo Cremonesi
Andrea Ghetti
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Impact of the As dose in m EEPROM technology: characterization and modeling
2001
Microelectronics Reliability
Nadia Galbiati
G. Ghidini
Carlo Cremonesi
Luca Larcher
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Analysis and Suppression of Process-Induced Defects in Memory Devices.
2000
MRS Proceedings
R. Annunziata
Roberta Bottini
P. Colpani
Carlo Cremonesi
G. Ghidini
E. Gomiero
G. Pavia
Federico Pio
Maria Luisa Polignano
G. Servalli
V. Higgs
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Process for the manufacture of a memory device electrically programmable non-volatile
1997
Roberta Bottini
Bruno Vajana
Libera Giovanna Dalla
Carlo Cremonesi
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