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W. H. Tu
W. H. Tu
National Chiao Tung University
Oxide
Electronic engineering
Dielectric strength
Capacitor
Root cause
2
Papers
5
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0
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Cell endurance prediction from a large-area SONOS capacitor
2009
IRPS | International Reliability Physics Symposium
Chienying Lee
W. H. Tu
S.H. Gu
C.-W. Wu
S.W. Lin
T. H. Yeh
K.F. Chen
Y. J Chen
J. Y. Hsieh
I. J. Huang
N. K. Zous
T.T. Han
M.S. Chen
Wen-Pin Lu
K.-C. Chen
Tahui Wang
Chih-Yuan Lu
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Citations (3)
Overall operation considerations for a SONOS-based memory
2009
VLSI-TSA | International Symposium on VLSI Technology, Systems, and Applications
Chienying Lee
W. H. Tu
L. H. Chong
S.H. Gu
K.F. Chen
Y. J Chen
J. Y. Hsieh
I. J. Huang
N. K. Zous
T.T. Han
M.S. Chen
Wen-Pin Lu
K.-C. Chen
Ta-Hui Wang
Chih-Yuan Lu
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Citations (2)
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