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Masayuki Iwase

Tokyo Institute of Technology

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Dependence of total ionizing dose effect of nMOS transistors on the on/off duty ratio of a gate voltage

2021 Japanese Journal of Applied Physics
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Radiation hardness evaluation of ELT in Ring-oscillator

2021 The Japan Society of Applied Physics
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Development of dynamic deterioration model of MOSFET under TID effect

2019 The Japan Society of Applied Physics
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