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Marcus Oswald
Marcus Oswald
Optics
Confusion
Flexural strength
Physics
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Microcracks in Silicon Wafers I: Inline Detection and Implications of Crack Morphology on Wafer Strength
2016
IEEE Journal of Photovoltaics
Matthias Demant
Tim Welschehold
Marcus Oswald
Sebastian Bartsch
Thomas Brox
Stephan Schoenfelder
Stefan Rein
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