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W. P. Chua
W. P. Chua
Electronic engineering
Materials science
Solid immersion lens
Laser
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3
Papers
9
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Overview of Wafer-level Electrical Failure Analysis Process for Accelerated Yield Engineering
2019
S. H. Goh
Y. H. Chan
B. L. Yeoh
H. Hao
M.H. Thor
Z Lin
C.M. Chua
S.H. Tan
L. S. Koh
W. P. Chua
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Effectiveness of frequency mapping on 28 nm device broken scan chain failures
2012
Review of Scientific Instruments
S. H. Goh
Yan Pan
G. F. You
Y. H. Chan
He Ran
Thomas Herrman
Thomas Heller
Victor Lim
Zhihong Mai
Jeffrey Lam
Cm Chua
W. P. Chua
Sh Tan
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Resolution and sensitivity enhancements of scanning optical microscopy techniques for integrated circuit failure analysis
2009
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
J.C.H. Phang
S. H. Goh
A.C.T. Quah
Choon Meng Chua
Lian Ser Koh
Suat-Hoon Tan
W. P. Chua
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Citations (2)
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