Old Web
English
Sign In
Acemap
>
authorDetail
>
Saied Khodabandeh
Saied Khodabandeh
LSI Corporation
Aerial image
Phase (waves)
Engineering drawing
Optical proximity correction
Critical dimension
1
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Statistical analysis of poly line printability affected by sPSM manufacturing errors
2004
Nadya Belova
John V. Jensen
Saied Khodabandeh
Ebo H. Croffie
Show All
Source
Cite
Save
Citations (0)
1