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M. Campola
M. Campola
Radiation
Absorbed dose
Transistor
Radiation hardening
Materials science
5
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2
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Total Ionizing Dose Test of Silicon Switching Transistors JANTXV2N2222AUB
2020
M. Campola
T. Carstens
A. Phan
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Screening Parts for Space Missions Using a Pulsed Laser to Test for Failures
2019
S. P. Buchner
Dale McMorrow
Jeffrey H. Warner
Ani Khachatrian
M. Campola
Jonathan A. Pellish
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Operational Performance of the High Energy X-ray Imaging Technology ASIC in Earth Orbit-Equivalent Radiation Environments
2018
Journal of Instrumentation
Daniel F. Ryan
Steven Christe
Matthew D. Wilson
S. Richards
L. Jones
A. Benmoussa
J. Newport
S Thomas
Wayne H. Baumgartner
S. Gissot
M. Prydderch
M. Campola
Albert Y. Shih
P. Seller
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Total Ionizing Dose Test of Microsemi's Silicon Switching Transistors JANTXV2N2222AUB and 2N2907AUB
2017
M. Campola
B. Freeman
K. Yau
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Single Event Effect Testing of the Texas Instruments' MAX4595 Single-Channel Analog Switch
2014
M. Campola
T. Wilcox
H. Kim
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