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Ezequiel Vidal Russel
Ezequiel Vidal Russel
Micron Technology
Metrology
Computer engineering
Computer vision
Data collection
Artificial intelligence
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Design-based metrology for development and manufacturing applications
2013
Proceedings of SPIE
Peter Brooker
Michael Lee
Ezequiel Vidal Russel
Shimon Levi
Sylvain Berthiaume
William Stanton
Travis Brist
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