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Ji-Min Zhang
Ji-Min Zhang
Minghsin University of Science and Technology
MOSFET
Optoelectronics
Breakdown voltage
Leakage (electronics)
Logic gate
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Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress
2020
Yu-Chen Lin
Kai-Chun Zhan
Ji-Min Zhang
Jian-Ming Chen
Cheng-Hsun-Tony Chang
Shea-Jue Wang
Mu-Chun Wang
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