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Peter Baumgartner

Intel

7

Papers

4

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Modeling and Analysis of High- Q Resonant-Fin Transistors

2021 IEEE Transactions on Electron Devices
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Matching Network Efficiency: The New Old Challenge for Millimeter-Wave Silicon Power Amplifiers

2021 IEEE Microwave Magazine
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Test structures for CMOS RF reliability assessment

2016 ICMTS | International Conference on Microelectronic Test Structures
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Detecting environmental conditions in a semiconductor chip

2013
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Challenges of RF and mixed signal design under process variability

2013 IOLTS | International On-Line Testing Symposium
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