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Seoungrag Lee
Seoungrag Lee
LG Electronics
White light scanner
Wafer-level packaging
Interferometry
Computer vision
Physics
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High speed Tilted white-light Scanning Interferometry system for package bumps inspection
2012
ISOT | International Symposium on Optomechatronic Technologies
Jehhoon Bhang
Seoungrag Lee
Kyoungseop Chang
YoungJun Roh
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