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Cem Basceri

Micron Technology

8

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Electrothermal evaluation of thick GaN epitaxial layers and AlGaN/GaN high-electron-mobility transistors on large-area engineered substrates

2017 Applied Physics Express
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Leakage mechanisms and dielectric properties of Al2O3/TiN-based metal-insulator-metal capacitors

2003 Applied Physics Letters
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Dielectric films and their manufacturing processes

2000
- Cem Basceri
- Dan Gealy
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