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Rakesh Vattikonda

Arizona State University

7

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1084

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Scalable model for predicting the effect of negative bias temperature instability for reliable design

2008 Iet Circuits Devices & Systems
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A New Simulation Method for NBTI Analysis in SPICE Environment

2007 ISQED | International Symposium on Quality Electronic Design
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Modeling and minimization of PMOS NBTI effect for robust nanometer design

2006 DAC | Design Automation Conference
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SRAM Cell Optimization for Ultra-Low Power Standby

2006 Journal of Low Power Electronics
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Predictive Modeling of the NBTI Effect for Reliable Design

2006 CICC | Custom Integrated Circuits Conference
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Citations (394)