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T. Lorin

6

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14

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A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT

2018 IRPS | International Reliability Physics Symposium
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On the Understanding of Cathode Related Trapping Effects in GaN-on-Si Schottky Diodes

2018 IEEE Journal of the Electron Devices Society
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Study of forward AC stress degradation of GaN-on-Si Schottky diodes

2018 Microelectronics Reliability
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A microsecond time resolved current collapse test setup dedicated to GaN-based Schottky diode characterization

2017 ICMTS | International Conference on Microelectronic Test Structures
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Citations (3)