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Sangah Lee
Sangah Lee
Samsung
Computer science
Reliability engineering
Design for manufacturability
Extreme ultraviolet lithography
Redundancy (engineering)
3
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Process related yield risk mitigation with in-design pattern replacement for system ICs manufactured at advanced technology nodes
2020
Jaehwan Kim
Jin Kim
Byungchul Shin
Sangah Lee
Jae-Hyun Kang
Joong-Won Jeon
Piyush Pathak
Jac Condella
Frank E. Gennari
Philippe Hurat
Ya-Chieh Lai
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A novel design-for-yield solution based on interconnect level layout improvements at 7nm technology node
2019
Jaehwan Kim
Sangah Lee
Byungchul Shin
Junsu Jeon
Jin Kim
Byung-Moo Kim
Jae-Hyun Kang
Seung Weon Paek
Piyush Pathak
Frank E. Gennari
Philippe Hurat
Ya-Chieh Lai
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Machine learning to improve accuracy of fast lithographic hotspot detection
2019
Namjae Kim
Kiheung Park
Jiwon Oh
Sangwoo Jung
Sangah Lee
Jae-Hyun Kang
Seung Weon Paek
Kareem Madkour
Wael ElManhawy
Aliaa Kabeel
Ahmed ElGhoroury
Marwah Shafee
Asmaa Rabie
Joe Kwan
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