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T. Garba-Seybou
T. Garba-Seybou
STMicroelectronics
Switching time
Electronic engineering
Radio frequency
Power (physics)
degradation
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Modeling hot carrier damage interaction between on and off modes for 28 nm AC RF applications
2021
Microelectronics Reliability
T. Garba-Seybou
Alain Bravaix
Xavier Federspiel
Florian Cacho
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