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R. De Tommasis
R. De Tommasis
Texas Instruments
Capacitor
Materials science
Analytical chemistry
Inorganic chemistry
Scanning electron microscope
2
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8
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Properties of stacked dielectric films composed of SiO2/Si3N4/SiO2
1999
Journal of Non-crystalline Solids
S. Santucci
L. Lozzi
M. Passacantando
A.R. Phani
E. Palumbo
G. Bracchitta
R. De Tommasis
A. Torsi
R. Alfonsetti
G. Moccia
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Citations (8)
Scanning capacitance microscope, an alternative technique to the C-V measurement for the SiO2 characterisation
1997
Journal of Non-crystalline Solids
F Bordoni
L. Fasciani
R. De Tommasis
A. Di Giacomo
G. Moccia
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