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Kavuri P. Purushotham

National Institute of Standards and Technology

6

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58

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Validation of Single Particle ICP-MS for Routine Measurements of Nanoparticle Size and Number Size Distribution

2018 Analytical Chemistry
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Nanomanufacturing concerns about measurements made in the SEM II: specimen contamination

2013 Proceedings of SPIE
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Does your SEM really tell the truth? Part 2

2013 Proceedings of SPIE
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Widening the Window of Particle Beam Technology: Helium Ion Microscopy

2012 Microscopy and Microanalysis
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AFM characterization of nanopositioner in-plane stiffnesses

2010 Sensors and Actuators A-physical
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Contamination specification for dimensional metrology SEMs

2008 Proceedings of SPIE
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Citations (17)