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Ariel Broitman
Ariel Broitman
Weizmann Institute of Science
Metrology
Throughput
Machine learning
Artificial intelligence
Computer science
2
Papers
1
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0
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Advanced machine learning eco-system to address HVM optical metrology requirements
2020
Padraig Timoney
Roma Luthra
Alex Elia
Haibo Liu
Paul Isbester
Avi Levy
Michael Shifrin
Barak Bringoltz
Eylon Rabinovich
Ariel Broitman
Eitan Rothstein
Ran Yacoby
Ilya M. Rubinovich
Yongha Kim
Ofer Shlagman
Barak Ben-Nahum
Marina Zolkin
Igor Turovets
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Machine Learning and Big Data in optical CD metrology for process control
2018
Barak Bringoltz
Eitan Rothstein
Ilya M. Rubinovich
YongHa Kim
Noam Tal
Oded Cohen
Shay Yogev
Ariel Broitman
Eylon Rabinovich
Tal Zaharoni
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