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Douglas Hunt
Douglas Hunt
IBM
Engineering
Electronic engineering
Failure analysis
Focused ion beam
Dram
3
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20
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Stress migration in a copper - Aluminum hybrid technology
2014
IRPS | International Reliability Physics Symposium
Cathryn Christiansen
Jonathan D. Chapple-Sokol
Michael Coster
Douglas Hunt
Tom C. Lee
William J. Murphy
Jeffrey P. Gambino
Edward C. Cooney
Timothy W. Kemerer
Richard J. Rassel
Tony Stamper
Gregory URen
Stephane Lariviere
Stephane Brandon
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A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization
2003
Microelectronics Reliability
Michael W. Ruprecht
Guenther Benstetter
Douglas Hunt
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A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification
2002
Microelectronics Reliability
Guenther Benstetter
Michael W. Ruprecht
Douglas Hunt
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Citations (5)
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