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Kenneth Wacks
Kenneth Wacks
Electronic engineering
Computer science
Joint Test Action Group
Boundary scan
Circuit design
4
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18
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0.01
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Toward Zero Net Energy (ZNE) Super High-Rise Commercial Buildings
2014
Albert So
Kenneth Wacks
Ken Wacks Associates
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The successes and failures of standardization in home systems
2001
SIIT | Standardization and Innovation in Information Technology
Kenneth Wacks
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Citations (13)
Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards.
1982
ITC | International Test Conference
Herold Levine
Charles Berking
Alan Blair
Kenneth R. Bowden
Peter deBruyn Kops
David Giles
David Ruhoff
Kenneth Wacks
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Citations (2)
Integrated Functional/Structural Timing for Digital Simulation.
1982
ITC | International Test Conference
David Giles
Charles Berking
Kenneth Wacks
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