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B. Wissman
B. Wissman
Analytical chemistry
Molecular beam epitaxy
Chemistry
Wafer
Optoelectronics
3
Papers
10
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In Situ Band-Edge Monitoring of Cd 1− y Zn y Te Substrates for Molecular Beam Epitaxy of HgCdTe
2019
Journal of Electronic Materials
R. N. Jacobs
B. Pinkie
J. Arias
J. D. Benson
L. A. Almeida
Alexander Brown
A. J. Stoltz
B. Wissman
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Dynamic Curvature and Stress Studies for MBE CdTe on Si and GaAs Substrates
2015
Journal of Electronic Materials
R. N. Jacobs
M. Jaime-Vasquez
C. M. Lennon
C. Nozaki
L. A. Almeida
Joseph G. Pellegrino
J. Arias
C. Taylor
B. Wissman
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Short wavelength band edge thermometry during molecular beam epitaxial growth of GaN on SiC substrates and detected adatom self-heating effects
2010
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
W. E. Hoke
D Barlett
T. D. Kennedy
B. Wissman
J. J. Mosca
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Citations (2)
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