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Adrian Oponowicz
Adrian Oponowicz
AGH University of Science and Technology
Optics
Synchrotron radiation
Residual stress
Diffraction
Chemistry
3
Papers
8
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Gradient of Residual Stress and Lattice Parameter in Mechanically Polished Tungsten Measured Using Classical X-rays and Synchrotron Radiation
2020
Metallurgical and Materials Transactions A-physical Metallurgy and Materials Science
Adrian Oponowicz
Marianna Marciszko-Wiąckowska
Andrzej Baczmanski
Manuela Klaus
Christoph Genzel
Sebastian Wroński
Kamila Kollbek
Mirosław Wróbel
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Multireflection grazing-incidence X-ray diffraction: a new approach to experimental data analysis
2019
Journal of Applied Crystallography
Marianna Marciszko-Wiąckowska
Adrian Oponowicz
Andrzej Baczmanski
Miroslaw Wrobel
C. Braham
Roman Wawszczak
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A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
2018
Journal of Applied Crystallography
Marianna Marciszko
Andrzej Baczmanski
M. Klaus
Christoph Genzel
Adrian Oponowicz
Sebastian Wroński
M. Wróbel
Chedly Braham
Habib Sidhom
Roman Wawszczak
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Citations (4)
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