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Jin Ju Kim
Jin Ju Kim
Samsung
Electronic engineering
Inverter
Physics
High-κ dielectric
Transistor
2
Papers
9
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0
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Reliability Assessment of 10nm FinFET Process Technology
2018
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Jin Ju Kim
Minjung Jin
Hyunchul Sagong
Sangwoo Pae
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Experimental study on BTI variation impacts in SRAM based on high-k/metal gate FinFET: From transistor level Vth mismatch, cell level SNM to product level Vmin
2015
IEDM | International Electron Devices Meeting
Changze Liu
Hyeonwoo Nam
Kangjung Kim
Seungjin Choo
Hye-jin Kim
Hyun-Jin Kim
Yoohwan Kim
Soonyoung Lee
Sungyoung Yoon
Jungin Kim
Jin Ju Kim
Lira Hwang
Sungmock Ha
Minjung Jin
Hyun Chul Sagong
Junekyun Park
Sangwoo Pae
Jongwoo Park
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Citations (7)
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