Old Web
English
Sign In
Acemap
>
authorDetail
>
J Van
J Van
Tomsk Polytechnic University
Reliability engineering
Simulation
Effective atomic number
Radiation
Mathematical model
1
Papers
1
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Adequacy Criteria of Models of the Cargo Inspection System with Material Discrimination Option
2016
S. P. Osipov
Sergei Chakhlov
Oleg S. Osipov
Alexander Shtein
J Van
Show All
Source
Cite
Save
Citations (1)
1