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B. Detlefs
B. Detlefs
Analytical chemistry
X-ray reflectivity
Materials science
Thin film
Band gap
5
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39
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Elemental depth profiling in transparent conducting oxide thin film by X-ray reflectivity and grazing incidence X-ray fluorescence combined analysis
2017
Spectrochimica Acta Part B: Atomic Spectroscopy
H. Rotella
Berenger Caby
Y. Ménesguen
Y. Mazel
A. Valla
D. Ingerle
B. Detlefs
Marie-Christine Lépy
A Novikova
G. Rodriguez
C. Streli
E. Nolot
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Citations (12)
An in-situ X-ray diffraction study on the electrochemical formation of PtZn alloys on Pt(1 1 1) single crystal electrode
2015
Applied Surface Science
Jakub Drnec
Dan Bizzotto
Francesco Carlà
Roman Fiala
A. Sode
O. Balmes
B. Detlefs
T. Dufrane
Roberto Felici
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Citations (4)
Cu(111)基板上のクラウンエーテル類薄膜の吸着構造と電子状態
2011
kera satosi
hosogai takuya
matida kaku yuki
yonezawa keiiti akira
yamamoto masayuki
sai umi syunsuke
nisi tatuhiko
Steffen Duhm
horie masaki
B. Detlefs
J. Zegenhagen
Alexander Gerlach
Frank Schreiber
ueno nobuo
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Origin of resistivity change in NiO thin films studied by hard x-ray photoelectron spectroscopy
2011
Journal of Applied Physics
P. Calka
E. Martínez
D. Lafond
S. Minoret
S. Tirano
B. Detlefs
J. Roy
Jörg Zegenhagen
C. Guedj
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Citations (22)
On The Use Of Synchrotron Radiation For The Characterization Of “TiN/Hfo2” Gate Stacks
2009
C. Gaumer
E. Martínez
Sandrine Lhostis
F. Fillot
Patrice Gergaud
B. Detlefs
J. Roy
Yanyu Mi
Jean Paul Barnes
Jörg Zegenhagen
A. Chabli
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Citations (1)
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