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Richard Scott Kern
Richard Scott Kern
Materials science
Dielectric
Thin film
Microstructure
Single crystal
3
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Defects Formed at InGaN/GaN and AlGaN/GaN Quantum Wells: Role of Dopants and Impurities
1998
Z. Liliental-Weber
S. Ruvimov
W. Swider
Yongbeom Dongj Kim
J. Washburn
Shugo Nakamura
Richard Scott Kern
Yan Chen
Joel K. W. Yang
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