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Patrick Huff
Patrick Huff
Microscopic scale
Material properties
Detector
Particle physics
Dark matter
3
Papers
1
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0.02
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The Detector Parameters Determining the Sensitivity of the CRESST-II Experiment
2010
Patrick Huff
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Improvement of the CRESST phonon/light detectors
2008
M. Kiefer
I. Bavykina
A.C.S.S.M. Bento
D. Hauff
Patrick Huff
R. F. Lang
Wolfgang Mai
E. Pantic
F. Petricca
F. Proebst
K. Schäeffner
Jens Schmaler
W. Seidel
Hans Seitz
Leo Stodolsky
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Review of Skin: A Natural History by Nina G. Jablonski
2007
Patrick Huff
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