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T. Lertvanithphol
T. Lertvanithphol
Thailand National Science and Technology Development Agency
Analytical chemistry
Ellipsometry
Materials science
Thin film
Sputter deposition
2
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2
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Quantitative relation between thickness and grafting density of temperature‐responsive poly(N‐isopropylacrylamide‐co‐acrylamide) thin film using synchrotron‐source ATR‐FTIR and spectroscopic ellipsometry
2020
Surface and Interface Analysis
Phongphot Sakulaue
T. Lertvanithphol
Pitak Eiamchai
Wanwipa Siriwatwechakul
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Spectroscopic study on amorphous tantalum oxynitride thin films prepared by reactive gas-timing RF magnetron sputtering
2019
Applied Surface Science
T. Lertvanithphol
Worawarong Rakreungdet
C. Chananonnawathorn
Pitak Eiamchai
S. Limwichean
Noppadon Nuntawong
V. Patthanasettakul
Annop Klamchuen
Narathon Khemasiri
Jiti Nukeaw
K. Seawsakul
C Songsiriritthigul
Narong Chanlek
Hideki Nakajima
Prayoon Songsiriritthigul
Mati Horprathum
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