Old Web
English
Sign In
Acemap
>
authorDetail
>
Bill Cruse
Bill Cruse
Logic gate
Dry etching
Analytical chemistry
Breakdown voltage
MOSFET
3
Papers
12
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Short-Circuit Capability with GaN HEMTs : Invited.
2022
IRPS | International Reliability Physics Symposium
Davide Bisi
Bill Cruse
Philip Zuk
Primit Parikh
Umesh K. Mishra
Tsutomu Hosoda
Masamichi Kamiyama
Masahito Kanamura
Show All
Source
Cite
Save
Citations (0)
Short-Circuit Capability Demonstrated for GaN Power Switches
2021
APEC | Applied Power Electronics Conference
Davide Bisi
John Gritters
Tsutomu Hosoda
Masamichi Kamiyama
Bill Cruse
Yulu Huang
J McKay
Geetak Gupta
Rakesh K. Lal
Carl J. Neufeld
Philip Zuk
Yifeng Wu
Primit Parikh
Umesh K. Mishra
Show All
Source
Cite
Save
Citations (0)
Improved Dynamic R ON of GaN Vertical Trench MOSFETs (OG-FETs) Using TMAH Wet Etch
2018
IEEE Electron Device Letters
Dong Ji
Wenwen Li
Anchal Agarwal
Silvia H. Chan
Jeffrey Haller
Davide Bisi
Michelle LaBrecque
Chirag Gupta
Bill Cruse
Rakesh K. Lal
Stacia Keller
Umesh K. Mishra
Srabanti Chowdhury
Show All
Source
Cite
Save
Citations (12)
1