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Joe Abys
Joe Abys
Copper
Nickel
Residual stress
Manufacturing engineering
Electronic engineering
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Residual Stress Properties of Nickel Sulfamate and Copper Sulfate Deposits
2011
Charles L. Arvin
George J. Scott
Charles Goldsmith
Christopher Parks
Chen Wang
Yun Zhang
Joe Abys
Ken Takahashi
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Considerations for the long term reliability of PCBs in harsh environmental conditions
2010
IMPACT | International Microsystems, Packaging, Assembly and Circuits Technology Conference
Jim Kenny
Karl F. Wengenroth
Joe Abys
Marco Mui
Jo Wynschenk
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