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F Peter
F Peter
Sandia National Laboratories
Thin film
Far-infrared laser
Deformation (engineering)
Optical power
Optical switch
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Static and Dynamic Optical Metrology of Micro-Mirror Thermal Deformation
2004
David P. Adams
O. Blum Spahn
Craig R. Forest
J. Harris
S. S. Mani
E Novak
F Peter
P Reynolds-Brown
Chungnin C. Wong
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