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K. Baerf
K. Baerf
Katholieke Universiteit Leuven
Materials science
Interferometry
Time of flight
Near-infrared spectroscopy
Wafer
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Thickness Characterization of Ultra Thin Wafers on Carrier
2007
EPTC | Electronics Packaging Technology Conference
Ricardo Cotrin Teixeira
K. De Munck
K. Baerf
Bart Swinnen
A. Knüttel
P. De Moor
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Citations (6)
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