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H. Syoji
H. Syoji
Electrode
MISFET
Materials science
Insulator (electricity)
Electronic engineering
5
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2
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0
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Gate-last MISFET structures and process for high-k and metal gate MISFETs characterization
2004
ICMTS | International Conference on Microelectronic Test Structures
Takeo Matsuki
Kazuyoshi Torii
Takeshi Maeda
H. Syoji
K. Kiyono
Yasushi Akasaka
Kiyoshi Hayashi
Naoki Kasai
Tsunetoshi Arikado
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ME-2 A study on the Vth shift of HMOx MISFETs with n+/p+ poly-Si and TiN gate electrodes fabricated by replacement gate process.
2003
Yasushi Akasaka
K. Miyagawa
H. Syoji
Takaaki Kawahara
Atsushi Horiuchi
R. Mitsuhashi
T. Maeda
Naoki Kasai
M. Yasuhira
Tsunetoshi Arikado
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A study on the V/sub th/ shift of HfAlO x MISFETs with n + /p + poly-Si and TiN gate electrodes fabricated by replacement gate process
2003
Yasushi Akasaka
Kazuhiro Miyagawa
H. Syoji
O. Ogawa
Takaaki Kawahara
Atsushi Horiuchi
Riichiro Mitsuhashi
Takeshi Maeda
A. Muto
Naoki Kasai
Mitsuo Yasuhira
Tsunetoshi Arikado
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28p-ZH-7 Reexamination of Si 3p1s Restonant Inelastic X-ray Scattering
1999
Toshiaki Iwazumi
T. Nakamura
H. Syoji
S Kishimoto
Rintaro Katano
Yasuhito Isozumi
Susumu Nanao
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D6. Clinical and Neuro-Histological Study of Amputee's Pains in Stumps.
1961
Neurologia Medico-chirurgica
T. Igari
S Yuasa
H. Syoji
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