Old Web
English
Sign In
Acemap
>
authorDetail
>
Shawming Ma
Shawming Ma
Optoelectronics
Materials science
Capacitor
Gate oxide
Plasma
4
Papers
9
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
An electrically conductive mesh voltage junction for an array of image sensors of answered active
2000
Jeremy A Theil
Lin Jane Mei-Jech
Min Cao
Gary W Ray
Shawming Ma
Xin Sun
Show All
Source
Cite
Save
Citations (0)
Active image sensor with an increased pin diode and a special connection structure
1999
Jeremy A Theil
Min Cao
Dietrich W. Vook
Frederick A. Perner
Xin Sun
Shawming Ma
Gary W Ray
Show All
Source
Cite
Save
Citations (0)
Plasma Induced Charging Damage On 30/spl Aring/ Gate Oxide Antenna MOS Capacitor Structure During Polysilicon Gate Etch
1997
PPID | International Symposium on Plasma Process-Induced Damage
Shawming Ma
Chiu Chi
Amr M. Bayoumi
B Langley
Min Cao
P. Marcoux
Wayne Greene
Gary W Ray
Show All
Source
Cite
Save
Citations (1)
Scalability Of Plasma Damage With Gate Oxide Thickness
1997
PPID | International Symposium on Plasma Process-Induced Damage
Amr M. Bayoumi
Shawming Ma
B Langley
M. Cox
M. Tavassoli
Carlos H. Diaz
Min Cao
P. Marcoux
Gary W Ray
Wayne Greene
Show All
Source
Cite
Save
Citations (8)
1