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T. Eckenrode
T. Eckenrode
Electronic engineering
Fault model
Application-specific integrated circuit
Parallel computing
Conventional memory
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Design and test of a 9-port SRAM for a 100 Gb/s STS-1 switch
2002
MTDT | Memory Technology, Design and Testing
R. Gibbins
R.D. Adams
T. Eckenrode
M. Ouellette
Yuejian Wu
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