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Juergen Smoliner

University of Vienna

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Calibrated Nanoscale Dopant Profiling and Capacitance of a High-Voltage Lateral MOS Transistor at 20 GHz Using Scanning Microwave Microscopy

2017 IEEE Transactions on Nanotechnology
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Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy Using Scanning Microwave Microscopy

2017 IEEE Transactions on Nanotechnology
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Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy

2015 Nanoscale
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