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J. Young
J. Young
NXP Semiconductors
Nondestructive testing
Explosive material
Mechanical engineering
Forensic engineering
Electronic engineering
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A 90nm BiCMOS technology featuring 400GHz f MAX SiGe:C HBT
2016
BCTM | Bipolar/BiCMOS Circuits and Technology Meeting
V. P. Trivedi
J. P. John
J. Young
T. Dao
D. Morgan
I. To
R. Ma
D. Hammock
S. Mehrotra
L. Radic
B. Grote
T. Roggenbauer
J. Kirchgessner
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Automated Inspection Device for Explosive Charge in Shells - AIDECS
1980
Hans Weber
A. P. Trippe
D. G. Costello
J. Young
L. Parks
C. A. Preskitt
Joseph John
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Evaluation of Californium-252-Based Neutron Radiography and Photon Scattering Techniques for the Inspection of Hot Iso-Statically Pressed Components of T-700 Aircraft Engine.
1976
H Harper
J. Young
J Baltgalvis
Hans Weber
Joseph John
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