author-photo

G E Sterbinsky

National Institute of Standards and Technology

1

Papers

2

Citations

Citation Trend

Filter By

Papers (1) Sort By

Journal Conference Others

Substitutional incorporation of Sn in compressively strained thin films of heavily-alloyed Ge1 − xSn x /Ge semiconductor probed by x-ray absorption and diffraction methods

2014 Semiconductor Science and Technology
Show All
- Source
- Cite
- Save
Citations (2)