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L. Nijsten
L. Nijsten
Netherlands Organisation for Applied Scientific Research
Particle
Detection limit
Surface roughness
Diffuse optical imaging
Analytical chemistry
2
Papers
4
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0
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2024
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Automatic threat evaluation for border security and surveillance
2019
A.C. van den Broek
J. van der Velde
R.M.E.M. van den Baar
L. Nijsten
R. van Heijster
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Citations (2)
Deep sub-wavelength metrology for advanced defect classification
2017
P. van der Walle
E. Kramer
J.C.J. van der Donck
Wouter Mulckhuyse
L. Nijsten
F.A. Bernal Arango
A. de Jong
E. van Zeijl
Helma E.T. Spruit
J.H. van den Berg
Gaurav Nanda
A.K. van Langen-Suurling
Paul F. A. Alkemade
S. F. Pereira
D.J. Maas
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Citations (2)
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