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Robert Francis Jones
Robert Francis Jones
Agere Systems
Ellipsometry
Reflectometry
Secondary ion mass spectrometry
Optics
Materials science
2
Papers
4
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Graded Si1−xGex Metrology Using a Multi‐Technology Optical System
2003
Heath Pois
Jacky Huang
Stephen Morris
Kevin Peterlinz
Shahin Zangooie
JinPing Liu
Boon Lay Tan
Dong Kyun Sohn
Robert Francis Jones
Curry Scheirer
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Optical determination of thickness and composition of buried strained Si1−xGex HBT alloys
2003
Applied Surface Science
C.M. Scheirer
Robert Francis Jones
P. Nguyen
Heath Pois
Shahin Zangooie
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Citations (3)
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