Improved Identifiability and Sample Complexity Analysis of Complete Dictionary Learning
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Identifiability
Sample (material)
Sample complexity
Dictionary Learning
We introduce a new sample complexity measure, which we refer to as split-sample growth rate. For any hypothesis $H$ and for any sample $S$ of size $m$, the split-sample growth rate $\hat{\tau}_H(m)$ counts how many different hypotheses can empirical risk minimization output on any sub-sample of $S$ of size $m/2$. We show that the expected generalization error is upper bounded by $O\left(\sqrt{\frac{\log(\hat{\tau}_H(2m))}{m}}\right)$. Our result is enabled by a strengthening of the Rademacher complexity analysis of the expected generalization error. We show that this sample complexity measure, greatly simplifies the analysis of the sample complexity of optimal auction design, for many auction classes studied in the literature. Their sample complexity can be derived solely by noticing that in these auction classes, ERM on any sample or sub-sample will pick parameters that are equal to one of the points in the sample.
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The structural identification problem in dynamic system theory is studied and the connection between structural identifiability and other identifiability concepts, including least-square identifiability, identifiability with noisy observations and identifiability of system matrix coefficients, is discussed. Conditions for structural identifiability are reviewed, and new results are derived for both local and global identifiability.
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We introduce a new sample complexity measure, which we refer to as split-sample growth rate. For any hypothesis $H$ and for any sample $S$ of size $m$, the split-sample growth rate $\hat{\tau}_H(m)$ counts how many different hypotheses can empirical risk minimization output on any sub-sample of $S$ of size $m/2$. We show that the expected generalization error is upper bounded by $O\left(\sqrt{\frac{\log(\hat{\tau}_H(2m))}{m}}\right)$. Our result is enabled by a strengthening of the Rademacher complexity analysis of the expected generalization error. We show that this sample complexity measure, greatly simplifies the analysis of the sample complexity of optimal auction design, for many auction classes studied in the literature. Their sample complexity can be derived solely by noticing that in these auction classes, ERM on any sample or sub-sample will pick parameters that are equal to one of the points in the sample.
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Abstract Identifiability guarantees that the mathematical model of a dynamic system is well defined in the sense that it maps unambiguously its parameters to the output trajectories. This paper casts identifiability in a set-membership (SM) framework and relates recently introduced properties, namely, SM-identifiability, μ-SM-identifiability, and ε-SM-identifiability, to the properties of parameter estimation problems. Soundness and ε-consistency are proposed to characterize these problems and the solution returned by the algorithm used to solve them. This paper also contributes by carefully motivating and comparing SM-identifiability, μ-SM-identifiability and ε-SM-identifiability with related properties found in the literature, and by providing a method based on differential algebra to check these properties.
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A private learner is an algorithm that given a sample of labeled individual examples outputs a generalizing hypothesis while preserving the privacy of each individual. In 2008, Kasiviswanathan et al. (FOCS 2008) gave a generic construction of private learners, in which the sample complexity is (generally) higher than what is needed for non-private learners. This gap in the sample complexity was then further studied in several followup papers, showing that (at least in some cases) this gap is unavoidable. Moreover, those papers considered ways to overcome the gap, by relaxing either the privacy or the learning guarantees of the learner.We suggest an alternative approach, inspired by the (non-private) models of semi-supervised learning and active-learning, where the focus is on the sample complexity of labeled examples whereas unlabeled examples are of a significantly lower cost. We consider private semi-supervised learners that operate on a random sample, where only a (hopefully small) portion of this sample is labeled. The learners have no control over which of the sample elements are labeled. Our main result is that the labeled sample complexity of private learners is characterized by the VC dimension.We present two generic constructions of private semi-supervised learners. The first construction is of learners where the labeled sample complexity is proportional to the VC dimension of the concept class, however, the unlabeled sample complexity of the algorithm is as big as the representation length of domain elements. Our second construction presents a new technique for decreasing the labeled sample complexity of a given private learner, while roughly maintaining its unlabeled sample complexity. In addition, we show that in some settings the labeled sample complexity does not depend on the privacy parameters of the learner.
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A private learner is an algorithm that given a sample of labeled individual examples outputs a generalizing hypothesis while preserving the privacy of each individual. In 2008, Kasiviswanathan et al. (FOCS 2008) gave a generic construction of private learners, in which the sample complexity is (generally) higher than what is needed for non-private learners. This gap in the sample complexity was then further studied in several followup papers, showing that (at least in some cases) this gap is unavoidable. Moreover, those papers considered ways to overcome the gap, by relaxing either the privacy or the learning guarantees of the learner. We suggest an alternative approach, inspired by the (non-private) models of semi-supervised learning and active-learning, where the focus is on the sample complexity of labeled examples whereas unlabeled examples are of a significantly lower cost. We consider private semi-supervised learners that operate on a random sample, where only a (hopefully small) portion of this sample is labeled. The learners have no control over which of the sample elements are labeled. Our main result is that the labeled sample complexity of private learners is characterized by the VC dimension. We present two generic constructions of private semi-supervised learners. The first construction is of learners where the labeled sample complexity is proportional to the VC dimension of the concept class, however, the unlabeled sample complexity of the algorithm is as big as the representation length of domain elements. Our second construction presents a new technique for decreasing the labeled sample complexity of a given private learner, while roughly maintaining its unlabeled sample complexity. In addition, we show that in some settings the labeled sample complexity does not depend on the privacy parameters of the learner.
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Sample complexity
Representation
Concept class
VC dimension
Supervised Learning
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We introduce a new sample complexity measure, which we refer to as split-sample growth rate. For any hypothesis $H$ and for any sample $S$ of size $m$, the split-sample growth rate $\hat{\tau}_H(m)$ counts how many different hypotheses can empirical risk minimization output on any sub-sample of $S$ of size $m/2$. We show that the expected generalization error is upper bounded by $O\left(\sqrt{\frac{\log(\hat{\tau}_H(2m))}{m}}\right)$. Our result is enabled by a strengthening of the Rademacher complexity analysis of the expected generalization error. We show that this sample complexity measure, greatly simplifies the analysis of the sample complexity of optimal auction design, for many auction classes studied in the literature. Their sample complexity can be derived solely by noticing that in these auction classes, ERM on any sample or sub-sample will pick parameters that are equal to one of the points in the sample.
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There have been many models developed to represent electric loads. However, the identifiability problem of load models has not been studied, that is whether the parameters of a model can be identified from a specified input–output experiment. A study is made of the identifiability of electric load models, and the basic concepts and definitions are introduced. Structural identifiability and input identifiability are studied and numerical identifiability is discussed.
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