Multicolor single-analyzer high-energy-resolution XES spectrometer for simultaneous examination of different elements
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The present work demonstrates the performance of a von Hámos high-energy-resolution X-ray spectrometer based on a non-conventional conical Si single-crystal analyzer. The analyzer is tested with different primary and secondary X-ray sources as well as a hard X-ray sensitive CCD camera. The spectrometer setup is also characterized with ray-tracing simulations. Both experimental and simulated results affirm that the conical spectrometer can efficiently detect and resolve the two pairs of two elements (Ni and Cu) Kα X-ray emission spectroscopy (XES) peaks simultaneously, requiring a less than 2 cm-wide array on a single position-sensitive detector. The possible applications of this simple yet broad-energy-spectrum crystal spectrometer range from quickly adapting it as another probe for complex experiments at synchrotron beamlines to analyzing X-ray emission from plasma generated by ultrashort laser pulses at modern laser facilities.Keywords:
X-Ray Spectroscopy
X-ray spectroscopy is an important method in exploring the material composition and elemental properties. Traditional spectrometers in X-ray spectroscopy include wavelength-dispersive type and semiconductors-based energy-dispersive type. The former possesses high energy resolution but low collecting efficiency and narrow spectral band coverage, while the latter is more efficient and wider in spectral range but give relatively low energy resolution. Spectrometers based on microcalorimeters serve as a new class of energy-dispersive type spectrometers which balance the performance in energy resolution, detection efficiency, and spectral coverage, making them promising in many spectroscopy applications. The superconducting transition-edge sensor (TES) is a representative class of maturely developed microcalorimeters success in array fabrication and readout. We are developing TESs-based X-ray spectrometer at ShanghaiTech University aiming at the application in advanced X-ray light source, like synchrotron radiation or free electron laser facilities. Recently, a prototype has been set up and started running in the lab. This paper introduces a systematic work on data processing with this prototype, focusing on both data acquisition and analysis. With optimization on both hardware and analysis, we have achieved resolution better than 7 eV in the range from 2 keV to 9 keV on the prototype.
Spectral resolution
X-Ray Spectroscopy
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This chapter contains sections titled: Quadrupole Analyzer Ion Trap Analyzer Linear Ion Trap Analyzer Time-of-Flight Analyzer Fourier Transform Analyzer Design Magnetic Sector Analyzers
Quadrupole ion trap
Hybrid mass spectrometer
Trap (plumbing)
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Solid angle
Acceptance angle
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Hard X-ray spectroscopy is an essential diagnostics used to understand physical processes that take place in high energy density plasmas produced by intense laser-plasma interactions. A bundle of hard X-ray detectors, of which the responses have different energy thresholds, is used as a conventional single-shot spectrometer for high-flux (>1013 photons/shot) hard X-rays. However, high energy resolution (Δhv/hv < 0.1) is not achievable with a differential energy threshold (DET) X-ray spectrometer because its energy resolution is limited by energy differences between the response thresholds. Experimental demonstration of a Compton X-ray spectrometer has already been performed for obtaining higher energy resolution than that of DET spectrometers. In this paper, we describe design details of the Compton X-ray spectrometer, especially dependence of energy resolution and absolute response on photon-electron converter design and its background reduction scheme, and also its application to the laser-plasma interaction experiment. The developed spectrometer was used for spectroscopy of bremsstrahlung X-rays generated by intense laser-plasma interactions using a 200 μm thickness SiO2 converter. The X-ray spectrum obtained with the Compton X-ray spectrometer is consistent with that obtained with a DET X-ray spectrometer, furthermore higher certainly of a spectral intensity is obtained with the Compton X-ray spectrometer than that with the DET X-ray spectrometer in the photon energy range above 5 MeV.
X-Ray Spectroscopy
Photon energy
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Superconducting tunnel junction (STJ) X-ray spectrometers have been developed for synchrotron-based high-resolution soft X-ray spectroscopy. We are quantifying the improvements in sensitivity and signal-to-noise ratio that STJ spectrometers can offer for the analysis of dilute specimens over conventional semiconductor and grating spectrometers. We present analytical equations to quantify the improvements in terms of spectrometer resolution, detection efficiency and count rate capabilities as a function of line separation and spectral background. We discuss the implications of this analysis for L-edge spectroscopy of first-row transition metals.
X-Ray Spectroscopy
Spectral resolution
Transition edge sensor
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Semiconductor detector
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The rotating-compensator/analyzer fixed-analyzer ellipsometer configuration proposed and discussed here combines the advantages of unambiguous polarization-state determination and insensitivity to detector polarization response shown by rotating-compensator (rotating-analyzer) fixed-analyzer instruments, with the self-calibration features of rotating-compensator rotating-analyzer configurations. Because such generality is not necessary for all ellipsometric applications, we compare this system to other automatic ellipsometers and suggest preferred configurations for several representative uses.
Ellipsometry
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Frequency response analysis has a wide usage as a method of system analysis. A frequency response analyzer based on LabVIEW is introduced in this paper. Compared with the traditional spectrum analyzer, it has many advantages such as a higher ratio of performance to price, wide usage, easy upgrade in performance, etc. The software and hardware structures of a frequency response analyzer are given, and its program realization is expounded in detail. Comparison with standard instrument has been carried out. Experiments show that the average amplitude error of this analyzer gets to 0.06 dB and the average phase error reaches 0.09°, which proves the analyzer credible in both precision and performance.
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Signal analyzer
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The design of a synchrotron x-ray liquid surface spectrometer at beamline X19C at the National Synchrotron Light Source is described. This spectrometer is capable of performing the full range of x-ray surface scattering techniques. A few examples of measurements made using this spectrometer are presented, including studies of organic monolayers on the surface of water and of the structure of strongly fluctuating oil–microemulsion interfaces. The measurements discussed illustrate the accuracy, resolution, and capabilities of the spectrometer.
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