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    Trieste semiconductor symposium:Amorphous semiconductor physics and applications 19–25 July 1980
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    Keywords:
    Amorphous semiconductors
    Amorphous semiconductors
    Charge carrier
    Electron Mobility
    Transient (computer programming)
    The possibilities of remote contact EBIC (REBIC) for semiconductor characterisation are discussed. Results of investigations on CdTe, PbTe and HgCdTe crystals are presented. It is shown that this technique is very suitable for in situ investigations of electron beam effects on semiconductor properties.
    Cadmium telluride photovoltaics
    Compound semiconductor
    Electron beam-induced current
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