Grafted PVDF Particles for Efficient Removal of Trace Lead (II) Ions in Aqueous Solution
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Acrylic acid
Ambient pressure
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X-ray photoelectron spectroscopy (XPS) is a surface-sensitive technique that gives information on the elemental composition of materials as well as on the chemical state of the elements. Here, the basic principles of XPS are presented. Information on the determination of functional groups is given, and the assistance of chemical derivatization is presented. Some problems related to XPS analysis are mentioned as well. The application of XPS is shown on various examples of polymers with functionalized surfaces or with deposited coatings.
Chemical state
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The adsorption of Pb2+ on activated carbon fiber ( ACF ) from aqueous solution was investigated. Adsorption isotherm and dynamic adsorption breakthrough curve were determined through static and dynamic adsorption, respectively. The influence of pH value and adsorption time on the adsorption was studied. The results indicated that ACF is good adsorbent for Pb 2+remo val from aqueous solution. Besides, ACF used is easy to be regenerated. So ACF could be used as an efficient adsorbent for Pb2+removal from water.
Sorption isotherm
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Undoped ZnO and ZnO:Er thin films were deposited on p-type Si substrates by ultrasonic spray pyrolisis (USP). Undoped and ZnO:Er thin films have been analyzed by using X-ray Photoelectron Spectroscopy (XPS). The results show that the XPS spectrum has two Er peak at ∼157 eV and ∼168 eV. The XPS Zn 2p spectrum of undoped ZnO and ZnO:Er thin films have binding energy for Zn 2p3/2 (~ 1021 eV) and Zn 2p1/2 (~1045eV) were found no shift in binding energy after the incorporation of Er. Meanwhile, after Er incorporates into ZnO, the O 1s spectrum is composed two peak of binding energy (BE) at ~530.5eV and the shoulder about 532.5 eV.Keywords: ZnO thin films, ZnO:Er, XPS, binding energy
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Photoelectric effect
Surface layer
Chemical state
Electron spectroscopy
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Mulberry shoot powder(MSP) is rich in cellulose and lignin,which can remove heavy metal cations from aqueous solution by adsorption.In this paper,MSP is employed to be as adsorbent to remove Cr(Ⅵ) from aqueous solution.The affecting factors on the adsorption of Cr(Ⅵ) from aqueous solution on MSP,such as pH,shaking time,MSP dose,and initial concentration of Cr(Ⅵ),were investigated.The adsorption isotherms were determined.The thermodynamics and kinetics for the adsorption were fitted.The results showed that adsorption efficiencies of Cr(Ⅵ) in water on MSP are high.The adsorptive capacity increases with the extension of adsorption time,and decreases with the rise of pH.The adsorption equilibrium time is 6 h.The removal rate of Cr(Ⅵ) increases with the increment of MSP dosage,and decreases with the rise of initial concentration of Cr(Ⅵ).The suitable conditions for the adsorption are as following: MSP,5 g/L;pH,1.5;temperature,25 ℃;shaking time,6 hours;initial concentration of Cr(Ⅵ),10 mg/L.The isothermal adsorption can be described well by Freundlich,Langmuir and Temkin models.Under this experimental condition,the adsorption of Cr(Ⅵ) on MSP appears monomolecular layer type.The adsorption performance is good.Cr(Ⅵ) is easy to be adsorbed.The law of dynamics for the adsorption can be simulated by pseudo-first order and pseudo-second order kinetics models.
Isothermal process
Langmuir adsorption model
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XPS（X-ray Photoelectron Spectroscopy: X 線光電子分光法） は AES（Auger Electron Spectroscopy:オージェ電 子分光法） や TOF-SIMS（Time-of-Flight Secondary Ion Mass Spectrometry:飛行時間型二次イオン質量分析法） とならぶ代表的な表面分析手法の一つである ． XPS を用いることにより物質表面の組成分析， さらには化学 結合状態の分析を行うことができる ． XPS はその取扱いの簡単さ ， データベースの豊富さ ， 実用的には帯電 補正が容易， などといったことから， 表面分析手法の中では最も幅広く用いられている手法である ． ここでは， XPS の基本原理， 装置の構成， スペクトルの測定と解析における基本的な留意点， および応用例について述 べる ．
Auger electron spectroscopy
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The feasibility of utilizing X‐ray photoelectron spectroscopy ( XPS ) to analyze room‐temperature ionic liquids ( RTILs ) was investigated in this study. Conventionally, the chemical structure of organic compounds is identified by nuclear magnetic resonance ( NMR ) spectroscopy. The properties of RTILs , especially their low vapor pressure, make it possible to analyze RTILs by using XPS . The usefulness of XPS on RTILs was confirmed by commercial RTILs . All atoms in RTILs were detected in survey XPS spectra, and the calculated atomic percentages matched well with theoretical values. After the verification of commercial RTILs by XPS , we synthesized three RTILs and investigated them with XPS . The atomic ratio and chemical environment of carbon in RTILs were verified by XPS . By adapting XPS to the investigation of RTILs , carbon atoms in different chemical environments were distinguishable by the binding energy shift, and the atomic ratio of the constituent atoms was identifiable after peak deconvolution. In addition, inorganic constituents were detected by XPS unlike in the case of NMR spectroscopy.
Chemical shift
Carbon fibers
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Abstract Polyaniline adsorbent prepared by chemical oxidation was developed to remove the humic acid (HA) in aqueous solution. The adsorbents showed the high adsorption capacity for aqueous HA with the maximum adsorption amount 126.58 mg g−1, and the adsorption isotherm obeyed the Langmuir model. The adsorption kinetics followed an initial diffusion-controlled and then an attachment-controlled adsorption process. The HA adsorption was not much impacted in the presence of Na+, K+, while Ca2+ ion in aqueous solution can evidently enhance the HA adsorption. The HA adsorption on polyaniline decreased with increasing solution pH owing to the electrostatic interaction between imine and amine of polyaniline and disassociated HA. The HA molecules adsorbed on the polyaniline can be effectively desorbed in 0.1 M NaOH solution, and regenerated adsorbent can be repeatedly used in the subsequently adsorption–regeneration cycles. Keywords: PolyanilineHumic acidAdsorptionAdsorption kineticsDesorptionElectrostatic interactionWater treatment
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