PM-06 Electronic Structure of Nitrogen-Doped Graphite Films Studied by Soft X-ray Emission Spectroscopy
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Introduction.- Absorption and Emission of Light.- Widths and Profiles of Spectral Lines.- Spectroscopic Instrumentation.- Lasers as Spectroscopic Light Sources.- Doppler-Limited Absorption and Fluorescence Spectroscopy with Lasers.- Nonlinear Spectroscopy.- Laser Raman Spectroscopy.- Laser Spectroscopy in Molecular Beams.- Optical Pumping and Double-Resonance Techniques.- Time-Resolved Laser Spectroscopy.- Coherent Spectroscopy.- Laser Spectroscopy of Collision Processes.- New Developments in Laser Spectroscopy.- Applications of Laser Spectroscopy.- References.- Index.
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We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet absorption spectroscopy at free-electron laser sources. Our approach requires an on-line spectrometer before the sample and a downstream bucket detector. We use this method to measure the absorption spectrum of silicon, silicon carbide and silicon nitride membranes in the vicinity of the silicon L2,3-edge. We show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response using a coarse energy scan with self-amplified spontaneous emission radiation. For the conditions of our experiment the energy resolution of the ghost-spectroscopy reconstruction is higher than the energy resolution reached by scanning the energy range by narrow spectral bandwidth radiation produced by the seeded free-electron laser. When we set the photon energy resolution of the ghost spectroscopy to be equal to the resolution of the measurement with the seeded radiation, the measurement time with the ghost spectroscopy method is shorter than scanning the photon energy with seeded radiation. The exact conditions for which ghost spectroscopy can provide higher resolution at shorter times than measurement with narrow band scans depend on the details of the measurements and on the properties of the samples and should be addressed in future studies.
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Abstract Soft X‐ray fluorescence (SXF) spectroscopy is X‐ray fluorescence (XRF) spectroscopy for low‐ and middle‐atomic‐number elements whose X‐ray absorption edges are in the soft X‐ray (SX) region. Electron beams have been used as excitation probes for ( nonresonant or normal ) SXF spectroscopy in laboratories. In addition, synchrotron radiation (SR) beams have been utilized as excitation probes, enabling selective excitation near the X‐ray absorption threshold. Selectively excited SXF involves soft X‐ray scattering, which can be regarded as a resonant soft X‐ray emission (SXE) spectroscopy. SXF and SXE spectroscopies provide element‐, orbital‐, and symmetry‐specific information. Thus, they are powerful tools for chemical analysis and materials characterization. In this article, the principles of SXF/SXE spectroscopies and instrumentation focused on gratings are described. Examples of nonresonant ( normal ) SXF and resonant SXE spectroscopies are shown, and details of the spectral profiles are explained. Resonant SXE spectroscopy of liquid water and operando observations of the electrode reactions are also demonstrated as advanced chemical analyses.
X-Ray Spectroscopy
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This chapter contains sections titled: Introduction Optical Emission Spectroscopy Optical Absorption Spectroscopy Laser Induced Fluorescence (LIF) Conclusion References
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We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet absorption spectroscopy at free-electron laser sources. Our approach requires an on-line spectrometer before the sample and a downstream bucket detector. We use this method to measure the absorption spectrum of silicon, silicon carbide and silicon nitride membranes in the vicinity of the silicon L2,3-edge. We show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response using a coarse energy scan with self-amplified spontaneous emission radiation. For the conditions of our experiment the energy resolution of the ghost-spectroscopy reconstruction is higher than the energy resolution reached by scanning the energy range by narrow spectral bandwidth radiation produced by the seeded free-electron laser. When we set the photon energy resolution of the ghost spectroscopy to be equal to the resolution of the measurement with the seeded radiation, the measurement time with the ghost spectroscopy method is shorter than scanning the photon energy with seeded radiation. The exact conditions for which ghost spectroscopy can provide higher resolution at shorter times than measurement with narrow band scans depend on the details of the measurements and on the properties of the samples and should be addressed in future studies.
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